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For the Inventor, By the Inventor

Poughkeepsie, NY, United States of America

Bryan J Robbins

USPTO Granted Patents = 16

Average Co-Inventor Count = 4.0

ph-index = 6

Forward Citations = 90(Granted Patents)


Location History:

  • Poughkeepsie, NY (US) (2001 - 2016)
  • Beavercreek, OH (US) (2011 - 2016)

Company Filing History:

goldMedal15 out of 164,108 
 
International Business Machines Corporation
 patents
silverMedal1 out of 832,680 
Other
 patents

Years Active: 2001-2016

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16 patents (USPTO):
1. 9274173 - Selective test pattern processor (2016-03-01),
2. 9274172 - Selective test pattern processor (2016-03-01),
3. 9244757 - Logic-built-in-self-test diagnostic method for root cause identification (2016-01-26),
4. 9244756 - Logic-built-in-self-test diagnostic method for root cause identification (2016-01-26),
5. 8443313 - Circuit design optimization (2013-05-14),
6. 8386230 - Circuit design optimization (2013-02-26),
7. 8095837 - Method and apparatus for improving random pattern testing of logic structures (2012-01-10),
8. 7934134 - Method and apparatus for performing logic built-in self-testing of an integrated circuit (2011-04-26),
9. 7921346 - Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD) (2011-04-05),
10. 7117415 - Automated BIST test pattern sequence generator software system and method (2006-10-03),
11. 6990076 - Synchronous bi-directional data transfer having increased bandwidth and scan test features (2006-01-24),
12. 6836865 - Method and apparatus for facilitating random pattern testing of logic structures (2004-12-28),
13. 6751765 - Method and system for determining repeatable yield detractors of integrated circuits (2004-06-15),
14. 6671838 - Method and apparatus for programmable LBIST channel weighting (2003-12-30),
15. 6532571 - Method to improve a testability analysis of a hierarchical design (2003-03-11),

Title: The Innovative Contributions of Bryan J Robbins

Introduction

Bryan J Robbins is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of semiconductor testing, holding a total of 16 patents. His work has advanced the methodologies and systems used in testing semiconductor devices, showcasing his expertise and innovative spirit.

Latest Patents

One of his latest patents is the Selective Test Pattern Processor. This invention describes a method, system, and computer program product designed to test semiconductor devices. The method involves receiving a set of test patterns for the semiconductor device, allowing a user to select a subset of these patterns. It also includes cataloging the content of pattern files associated with the selected subset to generate a catalog. The catalog is then processed to output test data to the semiconductor device. Another aspect of this invention is the system that includes an input interface to receive the test patterns and a processor to process the selected subset, ultimately outputting test data to the semiconductor device.

Career Highlights

Throughout his career, Bryan has worked with prominent companies, including International Business Machines Corporation (IBM). His experience in such a reputable organization has undoubtedly contributed to his innovative capabilities and understanding of semiconductor technology.

Collaborations

Bryan has collaborated with notable individuals in his field, including Donato Orazio Forlenza and Orazio Pasquale Forlenza. These collaborations have likely enriched his work and led to further advancements in semiconductor testing methodologies.

Conclusion

Bryan J Robbins is a distinguished inventor whose contributions to semiconductor testing have made a significant impact in the industry. His innovative patents and collaborations reflect his dedication to advancing technology.

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