The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Jan. 15, 2004
Donato O. Forlenza, Hopewell Junction, NY (US);
Orazio P. Forlenza, Hopewell Junction, NY (US);
William J. Hurley, Poughkeepsie, NY (US);
Bryan J. Robbins, Poughkeepsie, NY (US);
Donato O. Forlenza, Hopewell Junction, NY (US);
Orazio P. Forlenza, Hopewell Junction, NY (US);
William J. Hurley, Poughkeepsie, NY (US);
Bryan J. Robbins, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods and systems for reducing the volume of test data associated with built in self testing (BIST) test methodologies (e.g., logical BIST, array BIST, etc.) and pattern structures are provided. Embodiments of the present invention store a limited number of 'dynamic' test parameters for each test sequence that have changed relative to a previous test sequence.