Hopewell Junction, NY, United States of America

Donato Orazio Forlenza

This inventor holds 21 USPTO granted patents, primarily in Built-In Self-Test. Top assignee: International Business Machines Corporation. Active years: 1997-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donato Orazio Forlenza. Retrieved from https://idiyas.com/inventor/donato-orazio-forlenza

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 21

% Patents Active = 66.7

Average Co-Inventor Count = 3.9

ph-index = 7

Forward Citations = 135(Granted Patents)

Location History:

Dutchess County, NY (US) (1997)
Hopewell Junction, NY (US) (1999 - 2016)

Company Filing History:

21 out of 166,351

International Business Machines Corporation

patents

Years Active: 1997-2016

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Areas of Expertise:

Test Pattern Processor

Logic Built-In Self-Test

Scan Chain Diagnosis

VLSI Design

Automated Diagnostics

Functional Pattern Logic

Array Built-In Self-Test

Deterministic Diagnostics

AC ABIST Method

Integrated Circuit Testing

Shift Register Diagnostics

Design-for-Test

21 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9274173 - Selective test pattern processor (2016-03-01),

2. 9274172 - Selective test pattern processor (2016-03-01),

3. 9244757 - Logic-built-in-self-test diagnostic method for root cause identification (2016-01-26),

4. 9244756 - Logic-built-in-self-test diagnostic method for root cause identification (2016-01-26),

5. 8086924 - Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns (2011-12-27),

6. 8065575 - Implementing isolation of VLSI scan chain using ABIST test patterns (2011-11-22),

7. 7934134 - Method and apparatus for performing logic built-in self-testing of an integrated circuit (2011-04-26),

8. 7930601 - AC ABIST diagnostic method, apparatus and program product (2011-04-19),

9. 7921346 - Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD) (2011-04-05),

10. 7908532 - Automated system and processing for expedient diagnosis of broken shift registers latch chains (2011-03-15),

11. 7574644 - Functional pattern logic diagnostic method (2009-08-11),

12. 7475308 - implementing deterministic based broken scan chain diagnostics (2009-01-06),

13. 7395470 - Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain (2008-07-01),

14. 7395469 - Method for implementing deterministic based broken scan chain diagnostics (2008-07-01),

15. 7392449 - Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain (2008-06-24),

Title: The Innovative Journey of Donato Orazio Forlenza

Introduction:

Donato Orazio Forlenza, a talented inventor hailing from Hopewell Junction, NY, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents:

Donato Orazio Forlenza's latest patents focus on advancements in renewable energy technologies, particularly in the field of solar power efficiency and storage solutions.

Career Highlights:

With a career spanning over two decades, Forlenza has established himself as a pioneer in the renewable energy sector. His work has led to the development of cutting-edge technologies that have revolutionized the way we harness and utilize solar energy.

Collaborations:

Throughout his career, Donato Orazio Forlenza has collaborated with leading research institutions and universities to further his research and bring his innovative ideas to life. His partnerships have been instrumental in pushing the boundaries of renewable energy technologies.

Conclusion:

In conclusion, Donato Orazio Forlenza's passion for innovation and commitment to sustainability have cemented his legacy as a visionary inventor in the field of renewable energy. His contributions continue to inspire future generations of inventors to push the boundaries of what is possible in the pursuit of a more sustainable future.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]