The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Jul. 30, 2014
International Business Machines Corporation, Armonk, NY (US);
Donato O. Forlenza, Hopewell Junction, NY (US);
Orazio P. Forlenza, Hopewell Junction, NY (US);
Bryan J. Robbins, Beavercreek, OH (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of performing root cause identification for a failure on an integrated circuit with a logic built-in self-test (LBIST) system and an LBIST system to perform root cause identification are described. The method includes completing one or more cycles of test with the LBIST system, each of the one or more cycles implementing one or more macros associated with each of one or more channel scan paths. The method also includes identifying, using a processor, a failing cycle among the one or more cycles of test, identifying a failing channel scan path among the one or more channel scan paths associated with the failing cycle, and identifying the one or more macros associated with the failing channel scan path. The method further includes iteratively checking each of the one or more macros associated with the failing channel scan path to perform the root cause identification.