The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Jun. 09, 2005
Todd M. Burdine, Zanesville, OH (US);
Donato O. Forlenza, Hopewell Junction, NY (US);
Orazio P. Forlenza, Hopewell Junction, NY (US);
William J. Hurley, Poughkeepsie, NY (US);
Phong T. Tran, Poughkeepsie, NY (US);
Todd M. Burdine, Zanesville, OH (US);
Donato O. Forlenza, Hopewell Junction, NY (US);
Orazio P. Forlenza, Hopewell Junction, NY (US);
William J. Hurley, Poughkeepsie, NY (US);
Phong T. Tran, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, apparatus and computer program product are provided implementing a scan chain diagnostics technique. The diagnostics technique includes employing fuses coupled to latches of the scan chain to load a known logic value into the latches at known locations of the scan chain, and then unloading values from the scan chain, and if the scan chain is defective (for example, based on the unloaded logic values), then localizing a defect in the scan chain from the unloaded logic values by comparison thereof with the known locations of the latches of the scan chain loaded with the known logic value via the fuses. The scan chain may be predesigned with fuses spaced periodically across the chain every n latches to facilitate subsequent localization of a detected defect in the scan chain.