Introduction: William James Hurley, an esteemed inventor based in Poughkeepsie, NY, has made significant contributions to the field of diagnostics through his innovative inventions. With a total of 8 patents to his name, Hurley's work primarily focuses on advancing the methods and systems used in embedded memory diagnostics.

Latest Patents: Among his latest patents, Hurley has developed the "AC ABIST diagnostic method, apparatus and program product." This innovation facilitates high-speed bit fail mapping in embedded memory systems using an Array Built In Self Testing (ABIST) approach. This method employs a high-speed multiplied clock that synchronizes with an external tester's clock while collecting and storing fail data during testing phases. Another significant contribution is the method for implementing deterministic based broken scan chain diagnostics. This procedure generates a deterministic test pattern, loaded into scan chains via system data ports, ensuring thorough testing and identifying last switching latches critical for further physical failure analysis.

Career Highlights: William James Hurley currently works at International Business Machines Corporation (IBM), a company renowned for its technological advancements and commitment to innovation in the IT sector. His prolific career reflects a dedication to enhancing diagnostic methods that propel the technology industry forward.

Collaborations: Throughout his career, Hurley has collaborated with talented individuals like Donato Orazio Forlenza and Orazio Pasquale Forlenza. These partnerships have enriched his projects, fostering an environment of shared ideas and innovation.

Conclusion: William James Hurley's inventive spirit and commitment to improving diagnostic methodologies stand out in the realm of technology. His eight patents not only reflect his expertise but also contribute significantly to the advancements in embedded memory systems. As technologies continue to evolve, Hurley's innovations will likely play a pivotal role in shaping future diagnostic frameworks.

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