The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Dec. 04, 2003
Todd Michael Burdine, Wappingers Falls, NY (US);
Donato Orazio Forlenza, Hopewell Junction, NY (US);
Orazio Pasquale Forlenza, Hopewell Junction, NY (US);
William James Hurley, Poughkeepsie, NY (US);
Steven Michnowski, Wappingers Falls, NY (US);
James Bernard Webb, Wallkill, NY (US);
Todd Michael Burdine, Wappingers Falls, NY (US);
Donato Orazio Forlenza, Hopewell Junction, NY (US);
Orazio Pasquale Forlenza, Hopewell Junction, NY (US);
William James Hurley, Poughkeepsie, NY (US);
Steven Michnowski, Wappingers Falls, NY (US);
James Bernard Webb, Wallkill, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An apparatus, program product and method utilize an ABIST circuit provided on an integrated circuit device to assist in the identification and location of defects in a scan chain that is also provided on the integrated circuit device. In particular, a defect in a scan chain may be detected by applying a plurality of pattern sets to a scan chain coupled to an ABIST circuit, collecting scan out data generated as a result of the application of the plurality of pattern sets to the scan chain, and using the collected scan out data to identify a defective latch in the scan chain.