Company Filing History:
Years Active: 2004-2007
Title: Innovator Spotlight: Steven Michnowski - Pioneering Inventor from Wappingers Falls, NY
Introduction:
Steven Michnowski, a talented inventor hailing from Wappingers Falls, NY, has left a significant mark in the field of integrated circuits with his groundbreaking patents.
Latest Patents:
1. ABIST-assisted detection of scan chain defects: Steven's invention involves utilizing an ABIST circuit on an integrated circuit device to detect and locate defects in a scan chain. By applying various pattern sets and analyzing scan out data, defective latches in the scan chain can be identified efficiently.
2. Method and system for determining repeatable yield detractors of integrated circuits: Steven's method for LBIST testing integrated circuits involves generating multi-bit test patterns, grouping them by test pattern partitions, and comparing signatures to reference signatures to detect failures.
Career Highlights:
Steven Michnowski is affiliated with the prestigious International Business Machines Corporation (IBM), where he continues to drive innovation and contribute significantly to the technological advancements in the industry.
Collaborations:
Steven's innovative work has been bolstered by collaborations with esteemed colleagues such as Todd Michael Burdine and Donato Orazio Forlenza. Together, they have shared expertise and insights to push the boundaries of integrated circuit technology.
Conclusion:
In conclusion, Steven Michnowski's inventive spirit and dedication to advancing technology shines through in his remarkable patents and collaborations within the industry. His contributions have undoubtedly made a lasting impact on the world of integrated circuits.