The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2004
Filed:
Nov. 27, 2000
Richard F. Rizzolo, Red Hook, NY (US);
Rocco E. DeStefano, Rhinebeck, NY (US);
Joseph E. Eckelman, Hopewell Junction, NY (US);
Thomas G. Foote, Milan, NY (US);
Steven Michnowski, Wappingers Falls, NY (US);
Franco Motika, Hopewell Junction, NY (US);
Phillip J. Nigh, Williston, VT (US);
Bryan J. Robbins, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An exemplary embodiment of the invention is a method for LBIST testing integrated circuit. The method includes generating a plurality of multi-bit test patterns and grouping the multi-bit test patterns by a plurality of test pattern partitions including a first test pattern partition having a first number of bits and a second test pattern partition having second number of bits greater than the first number. The first test pattern partition is applied to the integrated circuit to generate a first signature that is compared to a first reference signature to detect a failure. The second test pattern partition is applied to the integrated circuit to generate a second signature that is compared to a second reference signature to detect a failure in the integrated circuit.