Rocco E DeStefano

Title: Rocco E DeStefano: Innovator in Integrated Circuit Testing

Introduction

Rocco E DeStefano is a notable inventor based in Rhinebeck, NY (US). He has made significant contributions to the field of integrated circuits, particularly in the area of testing methodologies. His innovative approach has led to the development of a patented method that enhances the reliability of integrated circuits.

Latest Patents

Rocco E DeStefano holds a patent for a "Method and system for determining repeatable yield detractors of integrated circuits." This invention focuses on a method for LBIST (Logic Built-In Self-Test) testing of integrated circuits. The method involves generating multiple multi-bit test patterns and organizing them into various test pattern partitions. The first partition, with a specific number of bits, is applied to the integrated circuit to produce a signature that is then compared to a reference signature to identify any failures. The second partition, which contains a greater number of bits, is similarly applied to detect additional failures in the integrated circuit.

Career Highlights

Rocco is associated with the International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to collaborate with other talented professionals in the field. His contributions have been instrumental in advancing the technology used in integrated circuit testing.

Collaborations

Rocco has worked alongside notable colleagues such as Richard Frank Rizzolo and Joseph E Eckelman. Their combined expertise has fostered an environment of innovation and excellence in their projects.

Conclusion

Rocco E DeStefano's work in integrated circuit testing exemplifies the impact of innovative thinking in technology. His patented methods contribute to the reliability and efficiency of integrated circuits, showcasing the importance of continuous advancement in this field.