International Business Machines Corporation

Rocco E DeStefano

Franco Motika

Phillip J Nigh

Richard Frank Rizzolo

Bryan J Robbins

Joseph E Eckelman

Thomas G Foote

Steven Michnowski

An exemplary embodiment of the invention is a method for LBIST testing integrated circuit. The method includes generating a plurality of multi-bit test patterns and grouping the multi-bit test patterns by a plurality of test pattern partitions including a first test pattern partition having a first number of bits and a second test pattern partition having second number of bits greater than the first number. The first test pattern partition is applied to the integrated circuit to generate a first signature that is compared to a first reference signature to detect a failure. The second test pattern partition is applied to the integrated circuit to generate a second signature that is compared to a second reference signature to detect a failure in the integrated circuit.

Method and system for determining repeatable yield detractors of integrated circuits

Growing community of inventors

Rhinebeck, NY, United States of America

Rocco E DeStefano