The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2011
Filed:
Feb. 16, 2008
Joseph Eckelman, Hopewell Jct, NY (US);
Donato O. Forlenza, Hopewell Junction, NY (US);
Orazio P. Forlenza, Hopewell Junction, NY (US);
Robert B. Gass, Pflugerville, TX (US);
Phong T. Tran, Highland, NY (US);
Joseph Eckelman, Hopewell Jct, NY (US);
Donato O. Forlenza, Hopewell Junction, NY (US);
Orazio P. Forlenza, Hopewell Junction, NY (US);
Robert B. Gass, Pflugerville, TX (US);
Phong T. Tran, Highland, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
This invention involves the use of the JTAG functional test patterns and exercisors to solve the problem of diagnosing broken scan chains in either a serial or a lateral broadside insertion manner across all latch system ports and to analyze the response data efficiently for the purpose of readily identifying switching and non-switching latches with the next to last non-switching latch being the point of the break within a defective scan chain(s). This comprehensive latch perturbation, in conjunction with iterative diagnostic algorithms is used to identify and to pinpoint the defective location in such a broken scan chain(s). This JTAG Functional test function and the JTAG test patterns ultimately derived therefrom, can take on different forms and origins, some external to a product and some internal to a product.