The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Sep. 30, 2014
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Donato O. Forlenza, Hopewell Junction, NY (US);
Orazio P. Forlenza, Hopewell Junction, NY (US);
Michael P. Grace, Waltham, VT (US);
Bryan J. Robbins, Poughkeepsie, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/28 (2006.01); G06F 11/25 (2006.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318371 (2013.01);
Abstract
A method, system, and computer program product to test a semiconductor device are described. The system includes an input interface to receive a set of test patterns to test the semiconductor device and a user selection corresponding to a subset of the set of test patterns. The system also includes a processor to process the subset of the set of test patterns to output test data to the semiconductor device.