The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2012

Filed:

Mar. 19, 2008
Applicants:

Mary P. Kusko, Hopewell Junction, NY (US);

Barry W. Krumm, Poughkeepsie, NY (US);

Patrick Meaney, Poughkeepsie, NY (US);

Bryan J. Robbins, Beavercreek, OH (US);

Inventors:

Mary P. Kusko, Hopewell Junction, NY (US);

Barry W. Krumm, Poughkeepsie, NY (US);

Patrick Meaney, Poughkeepsie, NY (US);

Bryan J. Robbins, Beavercreek, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test method and apparatus for randomly testing logic structures. The method includes identifying and analyzing a functional behavior of a logic structure to be covered during the random testing, modifying the logic structure such that the logic structure behaves in a functional manner during random testing, and generating patterns to exercise the modified logic structure.


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