The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2003
Filed:
Sep. 27, 2000
Timothy J. Koprowski, Newburgh, NY (US);
Mary P. Kusko, Hopewell Junction, NY (US);
Lawrence K. Lange, Wappingers Falls, NY (US);
Bryan J. Robbins, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An exemplary embodiment of the invention is a built-in self-test (BIST) method and apparatus for testing the logic circuits on an integrated circuit. Random test pattern data is generated by a random pattern generator. A random resistant fault analysis (RRFA) program is used to determine the weighting requirements, on a per channel basis, for testing the logic circuits. The weighting requirements from the RRFA program are applied to the random test pattern data resulting in weighted test pattern data. The weighted test pattern data is then programmably applied to the scan chain.