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For the Inventor, By the Inventor

Kodaira, Japan

Atsuko Yamaguchi

This inventor holds 22 USPTO granted patents, primarily in Image Processing Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Hitachi High-Tech Corporation. Active years: 2002-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Atsuko Yamaguchi. Retrieved from https://idiyas.com/inventor/atsuko-yamaguchi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 22

% Patents Active = 72.7

Average Co-Inventor Count = 3.7

ph-index = 10

Forward Citations = 347(Granted Patents)


Location History:

  • Higashimatsuyama, JP (2002 - 2004)
  • Kudaira, JP (2008 - 2010)
  • Kodaira, JP (2006 - 2015)
  • Tokyo, JP (2013 - 2020)

Company Filing History:

goldMedal12 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal9 out of 42,740 
 
Hitachi, Ltd.
 patents
bronzeMedal2 out of 1,395 
 
Hitachi High-Tech Corporation
 patents
where one patent can have more than one assignee

Years Active: 2002-2020

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Areas of Expertise:
Image Analysis
Charged Particle Beam
Semiconductor Inspection
Pattern Evaluation
Displacement Measurement
Data Analysis
High-Accuracy Evaluation
Document Retrieval
22 patents (USPTO):Explore Patents
1. 10724856 - Image analysis apparatus and charged particle beam apparatus (2020-07-28),
2. 10672119 - Inspection device (2020-06-02),
3. 9824938 - Charged particle beam device and inspection device (2017-11-21),
4. 9658063 - Method and device for line pattern shape evaluation (2017-05-23),
5. 9183622 - Image processing apparatus (2015-11-10),
6. 9123504 - Semiconductor inspection device and semiconductor inspection method using the same (2015-09-01),
7. 9000366 - Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns (2015-04-07),
8. 8401273 - Apparatus for evaluating degradation of pattern features (2013-03-19),
9. 8369602 - Length measurement system (2013-02-05),
10. 8300919 - Apparatus for data analysis (2012-10-30),
11. 7684937 - Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication (2010-03-23),
12. 7619751 - High-accuracy pattern shape evaluating method and apparatus (2009-11-17),
13. 7405835 - High-accuracy pattern shape evaluating method and apparatus (2008-07-29),
14. 7369703 - Method and apparatus for circuit pattern inspection (2008-05-06),
15. 7366620 - Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication (2008-04-29),

Title: Innovator Atsuko Yamaguchi: Pioneering Image Analysis Technologies

Introduction: Atsuko Yamaguchi, hailing from Kodaira, Japan, is an accomplished inventor with an impressive portfolio of 22 patents. His work primarily focuses on advancing image analysis and inspection technologies, significantly impacting manufacturing processes and element performance evaluations.

Latest Patents: Among his latest innovations, Yamaguchi has developed an image analysis apparatus designed to efficiently extract edges of upper layer patterns while minimizing interference from lower layer patterns. This apparatus comprises several calculation units that work in concert to analyze and process signal profiles effectively. Another notable invention is an inspection device capable of quantitatively evaluating patterns associated with manufacturing processes. This device employs an image analyzing unit to derive crucial indices, enabling higher precision in monitoring manufacturing quality.

Career Highlights: Yamaguchi has made significant contributions while working at prominent organizations, including Hitachi High-Technologies Corporation and Hitachi, Ltd. His innovative solutions have greatly enhanced the functionalities of these companies, particularly in technological advancements related to imaging and analysis.

Collaborations: Throughout his career, Yamaguchi has collaborated with notable colleagues such as Hiroki Kawada and Hiroshi Fukuda. Their joint efforts have fostered creativity and innovation, leading to the development of impactful technologies.

Conclusion: Atsuko Yamaguchi stands out as a visionary inventor whose contributions to image analysis and inspection technologies continue to shape the industry. His dedication to innovation is reflected in his extensive patent portfolio, cementing his status as a key player in advancing manufacturing processes in Japan and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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