The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Sep. 01, 2016
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Atsuko Yamaguchi, Tokyo, JP;

Kazuhisa Hasumi, Tokyo, JP;

Hitoshi Namai, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01B 15/04 (2006.01); G01N 23/2251 (2018.01); H01J 37/28 (2006.01); H01L 21/66 (2006.01); H01L 27/088 (2006.01);
U.S. Cl.
CPC ...
G01B 15/04 (2013.01); G01N 23/2251 (2013.01); H01J 37/28 (2013.01); G01B 2210/56 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/30141 (2013.01); G06T 2207/30148 (2013.01); H01J 2237/2815 (2013.01); H01J 2237/2816 (2013.01); H01L 22/12 (2013.01); H01L 27/0886 (2013.01);
Abstract

To provide an image analysis apparatus capable of easily extracting an edge of an upper layer pattern formed intersecting with a lower layer pattern so as not to be affected by the lower layer pattern, the image analysis apparatus includes a calculation unit that calculates an analysis range including a region where the lower layer pattern intersects with the upper layer pattern and a region where the lower pattern is not formed, a calculation unit that averages a plurality of signal profiles, a calculation unit that calculates a maximum value and a minimum value of a signal intensity, a calculation unit that calculates a threshold level difference using the maximum value and the minimum value, and a calculation unit that calculates the edge of the upper layer pattern on the signal profile.


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