Location History:
- Hitachinaka, JP (2015 - 2016)
- Tokyo, JP (2018 - 2020)
Company Filing History:
Years Active: 2015-2020
Title: Hitoshi Namai: Innovator in Image Analysis and Electron Microscopy
Introduction
Hitoshi Namai is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the fields of image analysis and electron microscopy, holding a total of 5 patents. His innovative work has advanced the capabilities of various analytical technologies.
Latest Patents
Namai's latest patents include an image analysis apparatus and a scanning electron microscope. The image analysis apparatus is designed to easily extract the edge of an upper layer pattern that intersects with a lower layer pattern, ensuring that the analysis is not affected by the lower layer. This apparatus features multiple calculation units that work together to determine the analysis range, average signal profiles, and calculate threshold levels to accurately identify the edge of the upper layer pattern.
The scanning electron microscope developed by Namai is capable of accurately determining the steps of a step pattern on a sample, regardless of the materials used in the groove and projection of the pattern. This microscope includes a beam source and two detection units that capture secondary electrons emitted from the sample at different angles. The processing unit then analyzes the ratio of signals from both detection units to obtain detailed information about the step pattern.
Career Highlights
Namai has worked with notable companies such as Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His experience in these organizations has allowed him to refine his skills and contribute to cutting-edge technologies in his field.
Collaborations
Throughout his career, Namai has collaborated with esteemed colleagues, including Fumihiro Sasajima and Satoru Yamaguchi. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Hitoshi Namai's contributions to image analysis and electron microscopy demonstrate his commitment to advancing technology. His innovative patents and collaborations highlight his role as a key figure in the field.