Tama, Japan

Atsuki Fukazawa

This inventor holds 80 USPTO granted patents and 11 published patent applications, primarily in Atomic Layer Deposition (CPC class H01L21-02274). Top assignees: Asm IP Holding B.v., Asm Japan K.k., Asm International N.v.. Active years: 2001-2026.

USPTO Granted Patents = 80 

% Patents Active = 97.5

Average Co-Inventor Count = 2.9

ph-index = 39

Forward Citations = 18,972(Granted Patents)

Forward Citations (Not Self Cited) = 17,716(Dec 10, 2025)


Inventors with similar research interests:

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Location History:

  • Nagayama Tama, JP (2001)
  • Chino, JP (2002)
  • Tami, JP (2005 - 2019)
  • Tama, JP (2001 - 2023)
  • Tokyo, JP (2010 - 2023)

Company Filing History:


Years Active: 2001-2026

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Areas of Expertise:
Atomic Layer Deposition
Silicon Nitride Films
Doped Silicon Oxides
Gap-Fill Technologies
Cyclic CVD
Plasma-Enhanced ALD
Thin Films
Semiconductor Devices
Surface Processing
Silicon Carbide Film
Dielectric Films
Subatmospheric Plasma
80 patents (USPTO):Explore Patents

Title: Atsuki Fukazawa: Pioneering Innovations in Silicon Nitride Films and Carbon-Containing Gap-Fill Layers

Introduction:

Atsuki Fukazawa, a brilliant inventor based in Tama, Japan, has been making tremendous contributions in the field of semiconductor technology. With an impressive portfolio of 77 patents, Fukazawa is recognized for his groundbreaking work in developing methods for forming silicon nitride films selectively and depositing silicon-free carbon-containing films as gap-fill layers. Let's take a closer look at his latest patents, notable career highlights, and collaborations with fellow innovators.

Latest Patents:

One of Fukazawa's latest patents involves a method for forming a silicon nitride film selectively on top/bottom portions, enabling the fabrication of layered structures within a trench. By applying voltage between parallel electrodes and utilizing plasma bombardment, different chemical resistance properties are introduced to the top/bottom and sidewall portions of the film. This technique allows for precise removal of the sidewall portion using wet etching, leaving behind a well-defined layer structure.

Another remarkable patent by Fukazawa focuses on depositing silicon-free carbon-containing films as gap-fill layers. This technique involves creating a viscous polymer in a gas phase by striking plasma in the presence of a volatile hydrocarbon precursor. Controlled parameters, such as precursor partial pressure and wafer temperature, are key to achieving a film with excellent filling capabilities.

Career Highlights:

Fukazawa's professional journey has been closely linked to the renowned companies ASM IP Holding B.V. and ASM Japan K.K. (formerly ASM International N.V.). Throughout his tenure, Fukazawa has continued to innovate and contribute significantly to the advancement of semiconductor fabrication processes.

Collaborations:

In his pursuit of innovation, Fukazawa has collaborated with esteemed colleagues, including Hideaki Fukuda and Nobuo Matsuki. Their collective expertise and dedication have led to groundbreaking discoveries, pushing the boundaries of semiconductor technology even further.

Conclusion:

Atsuki Fukazawa's exceptional contributions to the field of semiconductor technology, particularly in the development of silicon nitride films and carbon-containing gap-fill layers, have solidified his position as a pioneering innovator. With 77 patents to his name, Fukazawa's meticulous research and inventive mindset continue to shape the industry. We eagerly await to see further contributions from this visionary inventor.

Note: The information provided in this article is based on the given data and may not reflect the entirety of Atsuki Fukazawa's career or patent portfolio.

Profile summary based on public USPTO records.
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