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Almelo, Netherlands

Panalytical B.v.

USPTO Granted Patents = 31

EPO Patents = 18

Trademarks = 23

Forward Citations = 139

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44 inventors (with patents filed for the assignee):

Waltherus W Van Den Hoogenhof (5 out of 9 patents)

Charalampos Zarkadas (4 out of 5 patents)

Detlef Beckers (4 out of 14 patents)

4. Paul Fewster (4 out of 4 patents)

5. Petronella Emerentiana Hegeman (3 out of 6 patents)

6. Milen Gateshki (3 out of 11 patents)

7. Alexander Kharchenko (3 out of 6 patents)

8. Vladimir Kogan (3 out of 6 patents)

9. Bruno A R Vrebos (2 out of 2 patents)

10. Roger Meier (2 out of 2 patents)

11. Klaus Bethke (2 out of 3 patents)

12. Gustaaf Christian Brons (1 out of 3 patents)

13. Dick Kuiper (1 out of 1 patent)

14. Aleksandr Komelkov (1 out of 1 patent)

15. Mark Ingham (1 out of 1 patent)

31 patents: Sort by Forward Citations

1. 9851313 - Quantitative X-ray analysis—ratio correction (2017-12-26),

2. 9784699 - Quantitative X-ray analysis—matrix thickness correction (2017-10-10),

3. 9739730 - Quantitative X-ray analysis—multi optical path instrument (2017-08-22),

4. 9658352 - Method of making a standard (2017-05-23),

5. 9640292 - X-ray apparatus (2017-05-02),

6. 9547094 - X-ray analysis apparatus (2017-01-17),

7. 9506880 - Diffraction imaging (2016-11-29),

8. 9239305 - Sample holder (2016-01-19),

9. 9110003 - Microdiffraction (2015-08-18),

10. 8488740 - Diffractometer (2013-07-16),

11. 8477904 - X-ray diffraction and computed tomography (2013-07-02),

12. 8437451 - X-ray shutter arrangement (2013-05-07),

13. 8210000 - Bead furnace (2012-07-03),

14. 7978820 - X-ray diffraction and fluorescence (2011-07-12),

15. 7949092 - Device and method for performing X-ray analysis (2011-05-24),

PANALYTICAL B.V. is a leading global supplier of analytical instrumentation and software solutions. With over 70 years of experience, they offer a comprehensive range of high-quality products for scientific research, industrial process control, and quality assurance applications. PANALYTICAL's solutions encompass X-ray diffraction (XRD), X-ray fluorescence (XRF), near-infrared (NIR) and optical emission spectroscopy (OES), as well as complementary technologies. Their cutting-edge technology and expertise enable customers to gain valuable insights, improve their processes, and optimize their products. Visit their website to explore their wide range of analytical solutions and services.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Jan 6 2026

31 Patents

#1 in Almelo

#239 in Netherlands

#20,649 in the World

Almelo, Netherlands

Panalytical B.v.

Forward Citations = 139

44 inventors:

Waltherus W Van Den Hoogenhof (5 out of 9 patents)

Charalampos Zarkadas (4 out of 5 patents)

Detlef Beckers (4 out of 14 patents)

4. Paul Fewster (4 out of 4 patents)

5. Petronella Emerentiana Hegeman (3 out of 6 patents)

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