The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2017
Filed:
Mar. 03, 2015
Applicant:
Panalytical B.v., Almelo, NL;
Inventors:
Waltherus Van Den Hoogenhof, Almelo, NL;
Charalampos Zarkadas, Almelo, NL;
Assignee:
PANALYTICAL B.V., Almelo, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01); G01N 23/22 (2006.01); G01N 23/223 (2006.01); G01N 23/207 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2206 (2013.01); G01N 23/20 (2013.01); G01N 23/207 (2013.01); G01N 23/223 (2013.01); G01N 2223/071 (2013.01);
Abstract
A method of X-ray analysis measures X-ray diffraction in transmission. In order to carry out quantitative measurements, a background measurement is taken slightly away from the diffraction peak and the ratio of measured intensities used to correct for variations in sample composition.