Charalampos Zarkadas

Title: Charalampos Zarkadas: Innovator in X-ray Analysis

Introduction

Charalampos Zarkadas is a notable inventor based in Almelo, Netherlands. He has made significant contributions to the field of X-ray analysis, holding a total of five patents. His innovative methods have advanced the way X-ray spectra are analyzed, providing valuable tools for various applications.

Latest Patents

Zarkadas's latest patents include a method for the analysis of X-ray spectra using fitting. This method involves fitting a measured sample spectrum with a combination of at least one measured reference spectrum and at least one calculated function. The process includes measuring a reference spectrum from a sample, selecting regions of interest, and fitting the measured sample spectrum to a fit function. Another notable patent is related to quantitative X-ray analysis through ratio correction. This method measures X-ray diffraction in transmission and corrects for variations in sample composition by taking background measurements away from the diffraction peak.

Career Highlights

Throughout his career, Charalampos Zarkadas has worked with prominent companies such as Panalytical B.V. and Malvern Panalytical B.V. His expertise in X-ray analysis has made him a valuable asset in these organizations, contributing to advancements in analytical techniques.

Collaborations

Zarkadas has collaborated with notable colleagues, including Waltherus W Van Den Hoogenhof and Petronella Emerentiana Hegeman. These collaborations have further enriched his work and expanded the impact of his inventions.

Conclusion

Charalampos Zarkadas is a distinguished inventor whose work in X-ray analysis has led to significant advancements in the field. His innovative patents and collaborations highlight his commitment to improving analytical methods.