The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Mar. 04, 2015
Panalytical B.v., Almelo, NL;
Petronella Emerentiana Hegeman, Almelo, NL;
Gustaaf Christian Brons, Almelo, NL;
Aleksandr Komelkov, Almelo, NL;
Bruno A. R. Vrebos, Almelo, NL;
Waltherus Van Den Hoogenhof, Almelo, NL;
Charalampos Zarkadas, Almelo, NL;
PANALYTICAL B.V., Almelo, NL;
Abstract
Apparatus includes an X-ray source, a wavelength dispersive X-ray detector for measuring X-ray fluorescence (XRF) and an energy dispersive X-ray detectoragain for measuring X-ray fluorescence. Selected elements are measured using the wavelength dispersive process to reduce the overall measurement time compared with using only one of the two detectors or compared to a simple approach of measuring low atomic number elements with the wavelength dispersive detector and high atomic number elements with the energy dispersive detector. The selection can take place dynamically, in particular on the basis of the results of the energy-dispersive detector.