The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Feb. 17, 2015
Applicant:
Panalytical B.v., Almelo, NL;
Inventors:
Jeroen Rinsema, Enschede, NL;
Mark Alexander Pals, Enschede, NL;
Assignee:
PANALYTICAL B.V., Almelo, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G01T 7/08 (2006.01); G01N 23/207 (2006.01); B25J 9/00 (2006.01);
U.S. Cl.
CPC ...
G01T 7/08 (2013.01); B25J 9/0093 (2013.01); G01N 23/207 (2013.01); G01N 23/223 (2013.01); Y10S 901/15 (2013.01);
Abstract
X-ray analysis of a primary sample such as a flexible sheetuses apparatus having a primary sample holder such as a material feed-through systemfor moving the flexible sheet through the apparatus. An X-ray analysis headcontaining an X-ray source and an X-ray detector is mounted on a robot arm. The robot arm moves in three dimensions so that the analysis head can be brought into position to measure the flexible sheet as it is being brought through the apparatus by the material feed-through system.