Company Filing History:
Years Active: 2009-2011
Title: The Innovative Contributions of Roger Meier
Introduction
Roger Meier is a notable inventor based in Almelo, Netherlands. He has made significant contributions to the field of X-ray technology, holding a total of 2 patents. His work focuses on developing advanced instruments that enhance the capabilities of X-ray analysis.
Latest Patents
One of Roger Meier's latest patents is an instrument capable of both X-ray diffraction (XRD) and X-ray fluorescence (XRF) measurements. This innovative device arranges an X-ray source to create an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed angle for high-energy energy dispersive XRD. For XRF, a separate X-ray detection system is utilized. Another significant patent involves an X-ray apparatus that includes an X-ray source and an X-ray detector facing the source. This apparatus features an inlet that accepts a stream of particles and a guide system that directs the stream in free space between the X-ray source and detector, allowing for X-ray analysis on the particles in a sample region.
Career Highlights
Roger Meier is currently employed at Panalytical B.V., where he continues to innovate in the field of X-ray technology. His work has contributed to advancements in analytical techniques that are essential for various scientific applications.
Collaborations
Roger has collaborated with notable colleagues, including Alexander Kharchenko and Walter Van Den Hoogenhof, enhancing the collaborative spirit in his research endeavors.
Conclusion
Roger Meier's contributions to X-ray technology through his patents and collaborations highlight his role as a significant inventor in the field. His innovative instruments are paving the way for advancements in X-ray analysis.