The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2011

Filed:

Oct. 22, 2009
Applicants:

Alexander Kharchenko, Almelo, NL;

Roger Meier, Almelo, NL;

Walter Van Den Hoogenhof, Almelo, NL;

Inventors:

Alexander Kharchenko, Almelo, NL;

Roger Meier, Almelo, NL;

Walter van den Hoogenhof, Almelo, NL;

Assignee:

Panalytical B.V., Almelo, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
Abstract

An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray sourcecreating an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed anglefor high energy energy dispersive XRD For XRF, an X-ray detection system is used.


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