Panalytical B.v.

Roger Meier

Alexander Kharchenko

Karl-Ernst Wirth

Walter Van Den Hoogenhof

Sebastian Gehrke

An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray sourcecreating an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed anglefor high energy energy dispersive XRD For XRF, an X-ray detection system is used.

X-ray diffraction and fluorescence

X-ray apparatusincludes an X-ray source (), an X-ray detector () facing the X-ray source. Inlet () accepts a stream of particles and a guide system () guides the stream of particles () in free space between the X-ray source () and detector () so that X-ray analysis can be carried out on the particles in the stream () in a sample region () between the source () and the detector ().

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Almelo, Netherlands

Roger Meier