The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2009

Filed:

Mar. 16, 2006
Applicants:

Roger Meier, Almelo, NL;

Sebastian Gehrke, Erlangen, DE;

Karl-ernst Wirth, Erlangen, DE;

Inventors:

Roger Meier, Almelo, NL;

Sebastian Gehrke, Erlangen, DE;

Karl-Ernst Wirth, Erlangen, DE;

Assignee:

PANalytical B.V., Almelo, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
Abstract

X-ray apparatusincludes an X-ray source (), an X-ray detector () facing the X-ray source. Inlet () accepts a stream of particles and a guide system () guides the stream of particles () in free space between the X-ray source () and detector () so that X-ray analysis can be carried out on the particles in the stream () in a sample region () between the source () and the detector ().


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