The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Feb. 28, 2013
Applicant:
Panalytical B.v., Almelo, NL;
Inventors:
Detlef Beckers, Almelo, NL;
Milen Gateshki, Almelo, NL;
Assignee:
PANALYTICAL B.V., Almelo, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2006.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01); G01N 2223/313 (2013.01);
Abstract
A method of X-ray diffraction illuminates a beam () of X-rays along an illuminated strip () on a surface () of a sample (). The X-rays are diffracted by the sample () and pass through a mask () having a slit extending essentially perpendicularly to the strip (). The X-rays are detected by a two-dimensional X-ray detector to measure the diffracted X-rays at different positions along the strip ().