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Sunnyvale, CA, United States of America

Nuflare Technology America, Inc.

USPTO Granted Patents = 19

Forward Citations = 16

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10 inventors (with patents filed for the assignee):

Victor Katsap (13 out of 15 patents)

John Hartley (6 out of 6 patents)

Munehiro Ogasawara (4 out of 72 patents)

4. Kazuhiko Inoue (3 out of 39 patents)

5. Atsushi Ando (3 out of 52 patents)

6. Chising Lai (2 out of 3 patents)

7. Riki Ogawa (1 out of 64 patents)

8. Yoshikuni Goshima (1 out of 8 patents)

9. Steven D Golladay (1 out of 22 patents)

10. Rodney A Kendall (1 out of 30 patents)

19 patents: Sort by Forward Citations

1. 12165834 - Method and apparatus for Schottky TFE inspection (2024-12-10),

2. 12131883 - Method and apparatus for usable beam current and brightness in Schottky thermal field emission (TFE) (2024-10-29),

3. 11901154 - Conical heat shield for electron emitting cathode (2024-02-13),

4. 11823862 - Method and apparatus for usable beam current and brightness in Schottky thermal field emission (TFE) (2023-11-21),

5. 11699564 - Schottky thermal field emitter with integrated beam splitter (2023-07-11),

6. 11640896 - Method and apparatus for Schottky TFE inspection (2023-05-02),

7. 11621144 - Electron optical system and multi-beam image acquiring apparatus (2023-04-04),

8. 11615938 - High-resolution multiple beam source (2023-03-28),

9. 11562879 - Low-blur electrostatic transfer lens for multi-beam electron gun (2023-01-24),

10. 11145485 - Multiple electron beams irradiation apparatus (2021-10-12),

11. 11139138 - Multiple electron beams irradiation apparatus (2021-10-05),

12. 10937623 - Deflector for multiple electron beams and multiple beam image acquiring apparatus (2021-03-02),

13. 10886102 - Multiple electron beam irradiation apparatus, multiple electron beam irradiation method, and multiple electron beam inspection apparatus (2021-01-05),

14. 10734190 - Multiple electron beam irradiation apparatus, multiple electron beam inspection apparatus and multiple electron beam irradiation method (2020-08-04),

15. 10714311 - Individual beam detector for multiple beams, multi-beam irradiation apparatus, and individual beam detection method for multiple beams (2020-07-14),

Company Overview

Nuflare Technology America, Inc. is a prominent player in the semiconductor industry, specializing in the development and manufacturing of advanced photomasks and mask-related technologies. The company focuses on providing innovative solutions that enhance the performance and efficiency of semiconductor fabrication processes. With its headquarters in Sunnyvale, California, Nuflare is strategically positioned to serve a global market, contributing to the advancement of cutting-edge technologies in electronics and integrated circuits.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

19 Patents

#197 in Sunnyvale, CA

#4,099 in California

#17,138 in US

#32,663 in the World

Sunnyvale, CA, United States of America

Nuflare Technology America, Inc.

Forward Citations = 16

10 inventors:

Victor Katsap (13 out of 15 patents)

John Hartley (6 out of 6 patents)

Munehiro Ogasawara (4 out of 72 patents)

4. Kazuhiko Inoue (3 out of 39 patents)

5. Atsushi Ando (3 out of 52 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nuflare Technology America, Inc.. Retrieved from https://idiyas.com/company/nuflare-technology-america

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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