For the Inventor, By the Inventor

Enter assignee name

Sunnyvale, CA, United States of America

Nuflare Technology America, Inc.

USPTO Granted Patents = 19

Forward Citations = 14

Loading Chart...

Loading Chart...

10 inventors (with patents filed for the assignee):

Victor Katsap (13 out of 15 patents)

John Hartley (6 out of 6 patents)

Munehiro Ogasawara (4 out of 72 patents)

4. Kazuhiko Inoue (3 out of 39 patents)

5. Atsushi Ando (3 out of 51 patents)

6. Chising Lai (2 out of 3 patents)

7. Riki Ogawa (1 out of 64 patents)

8. Yoshikuni Goshima (1 out of 8 patents)

9. Steven D Golladay (1 out of 22 patents)

10. Rodney A Kendall (1 out of 30 patents)

19 patents: Sort by Forward Citations

1. 12165834 - Method and apparatus for Schottky TFE inspection (2024-12-10),

2. 12131883 - Method and apparatus for usable beam current and brightness in Schottky thermal field emission (TFE) (2024-10-29),

3. 11901154 - Conical heat shield for electron emitting cathode (2024-02-13),

4. 11823862 - Method and apparatus for usable beam current and brightness in Schottky thermal field emission (TFE) (2023-11-21),

5. 11699564 - Schottky thermal field emitter with integrated beam splitter (2023-07-11),

6. 11640896 - Method and apparatus for Schottky TFE inspection (2023-05-02),

7. 11621144 - Electron optical system and multi-beam image acquiring apparatus (2023-04-04),

8. 11615938 - High-resolution multiple beam source (2023-03-28),

9. 11562879 - Low-blur electrostatic transfer lens for multi-beam electron gun (2023-01-24),

10. 11145485 - Multiple electron beams irradiation apparatus (2021-10-12),

11. 11139138 - Multiple electron beams irradiation apparatus (2021-10-05),

12. 10937623 - Deflector for multiple electron beams and multiple beam image acquiring apparatus (2021-03-02),

13. 10886102 - Multiple electron beam irradiation apparatus, multiple electron beam irradiation method, and multiple electron beam inspection apparatus (2021-01-05),

14. 10734190 - Multiple electron beam irradiation apparatus, multiple electron beam inspection apparatus and multiple electron beam irradiation method (2020-08-04),

15. 10714311 - Individual beam detector for multiple beams, multi-beam irradiation apparatus, and individual beam detection method for multiple beams (2020-07-14),

NuFlare Technology America, Inc. is a leading provider of electron beam lithography solutions for the semiconductor industry. With expertise in mask writers and direct write systems, NuFlare enables manufacturers to create high-precision patterns on various materials used in the production of integrated circuits and other electronic devices. By delivering advanced lithography solutions, NuFlare helps drive technological advancements and enables the development of cutting-edge semiconductor devices.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

19 Patents

#159 in Sunnyvale, CA

#3,964 in California

#16,592 in US

#31,670 in the World

Sunnyvale, CA, United States of America

Nuflare Technology America, Inc.

Forward Citations = 14

10 inventors:

Victor Katsap (13 out of 15 patents)

John Hartley (6 out of 6 patents)

Munehiro Ogasawara (4 out of 72 patents)

4. Kazuhiko Inoue (3 out of 39 patents)

5. Atsushi Ando (3 out of 51 patents)

Please report any incorrect information to support@idiyas.com

Loading…