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National Institute of Metrology, China

USPTO Granted Patents = 29

EPO Patents = 1

Forward Citations = 2

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96 inventors (with patents filed for the assignee):

Xiang Fang (7 out of 13 patents)

Zhihua Liu (5 out of 30 patents)

Chenguang Cai (5 out of 11 patents)

4. You Jiang (5 out of 6 patents)

5. Ming Yang (4 out of 215 patents)

6. Xingchuang Xiong (4 out of 5 patents)

7. Zejian Huang (4 out of 5 patents)

8. Wei Li (3 out of 303 patents)

9. Ping Yang (3 out of 9 patents)

10. Zhen-Dong Zhu (3 out of 79 patents)

11. Si-Tian Gao (3 out of 3 patents)

12. Xin Zhou (2 out of 114 patents)

13. Lu Huang (2 out of 7 patents)

14. Yan Xia (2 out of 14 patents)

15. Wenli Liu (2 out of 4 patents)

29 patents: Sort by Forward Citations

1. 12488912 - Standard for near end crosstalk of category 6A cable (CAT 6A) (2025-12-02),

2. 12483426 - Method for using RFID tags as carriers for digital calibration certificates and its system (2025-11-25),

3. 12467942 - On-site reciprocity calibration method for piezoelectric accelerometer (2025-11-11),

4. 12450316 - Detection method, system, medium and device based on multi-spectral data fusion (2025-10-21),

5. 12424430 - Ion storage system and method based on quadrupole-ion trap tandem mass spectrometry (2025-09-23),

6. 12294345 - Standard circuit and standard for far-end crosstalk of category 6A cable (CAT 6A) (2025-05-06),

7. 12287268 - FPGA-based multi-channel dynamic light scattering autocorrelation system and method (2025-04-29),

8. 12205681 - Nuclide identification method, system and electronic device (2025-01-21),

9. 12188831 - BRDF measurement system and method, electronic device, and storage medium (2025-01-07),

10. 12174017 - Composite measurement system for measuring nanometer displacement (2024-12-24),

11. 12158340 - Device and method for measuring laser displacement (2024-12-03),

12. 12140425 - Four-quadrant interferometry system based on an integrated array wave plate (2024-11-12),

13. 12137177 - Credible alliance blockchain digital calibration certificate system and operation method therefor (2024-11-05),

14. 12130313 - System and method for verifying alternating current (AC)/direct current (DC) conversion of ultralow-frequency voltage based on quantum technology (2024-10-29),

15. 12026895 - Monocular vision-based method for measuring displacement and trajectory of planar motion (2024-07-02),

National Institute of Metrology, China is the national metrology institute in China responsible for developing national measurement standards and providing metrology services. It is a key organization for ensuring accuracy and consistency in measurements across various industries and sectors in China.

This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 30 2025

29 Patents

#127 in Beijing

#938 in China

#21,864 in the World

National Institute of Metrology, China

Forward Citations = 2

96 inventors:

Xiang Fang (7 out of 13 patents)

Zhihua Liu (5 out of 30 patents)

Chenguang Cai (5 out of 11 patents)

4. You Jiang (5 out of 6 patents)

5. Ming Yang (4 out of 215 patents)

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