Company Filing History:
8 out of 15,586 
2 out of 16 
2 out of 30 
Years Active: 2016-2024
Title: Innovations of Yan Xia in Measurement Technologies
Introduction
Yan Xia is a prominent inventor based in Beijing, China, known for his significant contributions to measurement technologies. With a total of 14 patents to his name, he has developed innovative methods that enhance the accuracy and efficiency of motion measurement.
Latest Patents
One of Yan Xia's latest patents is a monocular vision-based method for measuring displacement and trajectory of planar motion. This method involves collecting a sequence image of a high-contrast feature mark fixed on a moving plane using a camera. By extracting sub-pixel coordinates of the feature edge through a sub-pixel edge detection method, the coordinates are converted into corresponding world coordinates. The world coordinates are then fitted based on a least squares principle to obtain a straight line of the feature edge, allowing for decoupling measurement of displacement in both the X and Y directions. The planar motion trajectory is derived from these measurements.
Another notable patent is the six-degree-of-freedom measurement method by machine vision based on physical decoupling. In this method, a point projector emits three laser beams that are perpendicular to each other and are projected onto a rear-projection screen as three laser points. A camera collects motion images, and the plane coordinates of the laser points are processed to obtain six-degree-of-freedom information of the measured object through a mathematical decoupling model.
Career Highlights
Yan Xia has worked with notable organizations such as Honeywell International Inc. and Guizhou University. His experience in these institutions has contributed to his expertise in measurement technologies and innovation.
Collaborations
Some of Yan Xia's coworkers include Henry Chen and Jian Geng Du, who have collaborated with him on various projects and research initiatives.
Conclusion
Yan Xia's innovative approaches to measurement technologies have made a significant impact in the field. His patents reflect a deep understanding of machine vision and measurement principles, showcasing his role as a leading inventor in this domain.
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