The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Oct. 22, 2021
Guizhou University, Guizhou, CN;
National Institute of Metrology, China, Beijing, CN;
Ming Yang, Guiyang, CN;
Chenguang Cai, Beijing, CN;
Zhihua Liu, Beijing, CN;
Wen Ye, Beijing, CN;
Ying Zhang, Beijing, CN;
Yan Xia, Beijing, CN;
Lei Fu, Guiyang, CN;
Guizhou University, Guiyang, CN;
National Institute of Metrology, China, Beijing, CN;
Abstract
A monocular vision-based method for measuring displacement and trajectory of planar motion. In this method, a sequence image of a motion of a high-contrast feature mark fixed on a moving plane to be measured is collected using a camera. A sub-pixel coordinate of a feature edge of a linear motion of the sequence in an X direction and a Y direction is extracted using a sub-pixel edge detection method, and the sub-pixel coordinate is converted into a corresponding world coordinate. The world coordinate of the feature edge is fitted based on a least squares principle to obtain a straight line of the feature edge to realize decoupling measurement of a displacement in the X direction and the Y direction. The planar motion trajectory is obtained through measuring the displacement in the X direction and the Y direction.