Company Filing History:
Years Active: 2018-2024
Title: Innovations of Inventor Wen Ye
Introduction
Wen Ye is a prominent inventor based in Beijing, China. He has made significant contributions to the field of measurement technology, particularly through his innovative methods utilizing machine vision. With a total of three patents to his name, Wen Ye continues to push the boundaries of what is possible in his area of expertise.
Latest Patents
Wen Ye's latest patents include a "Monocular vision-based method for measuring displacement and trajectory of planar motion." This method involves collecting a sequence image of a high-contrast feature mark fixed on a moving plane using a camera. The sub-pixel coordinates of the feature edge are extracted and converted into world coordinates, allowing for precise measurement of displacement in both the X and Y directions. The planar motion trajectory is then obtained through these measurements.
Another notable patent is the "Six-degree-of-freedom measurement method by machine vision based on physical decoupling." In this method, a point projector emits three laser beams that are projected onto a rear-projection screen. A camera collects motion images, and the plane coordinates of the laser points are processed to obtain six-degree-of-freedom information of the measured object. This innovative approach enhances the accuracy and efficiency of spatial measurements.
Career Highlights
Wen Ye has worked with esteemed institutions such as Guizhou University and the National Institute of Metrology, China. His experience in these organizations has allowed him to develop and refine his innovative measurement techniques. His work has garnered attention in the field, contributing to advancements in machine vision and measurement technology.
Collaborations
Wen Ye has collaborated with notable colleagues, including Chenguang Cai and Zhihua Liu. These partnerships have facilitated the exchange of ideas and expertise, further enhancing the impact of his inventions.
Conclusion
Wen Ye's contributions to measurement technology through his innovative patents demonstrate his commitment to advancing the field. His work not only showcases his ingenuity but also highlights the importance of collaboration in driving technological progress.
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