The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Oct. 22, 2021
National Institute of Metrology, China, Beijing, CN;
Guizhou University, Guizhou, CN;
Chenguang Cai, Beijing, CN;
Ying Zhang, Beijing, CN;
Zhihua Liu, Beijing, CN;
Ming Yang, Guizhou, CN;
Wen Ye, Beijing, CN;
Yan Xia, Beijing, CN;
National Institute of Metrology, China, Beijing, CN;
Guizhou University, Guiyang, CN;
Abstract
A six-degree-of-freedom measurement method by machine vision based on physical decoupling. A point projector capable of emitting three laser beams perpendicular to each other is placed on a measured object. A rear-projection screen is configured to allow the three laser beams to be projected thereon as three laser points. The collection of motion images is performed by a camera. Plane coordinates of the three laser points are obtained by processing a sequence image. A mathematical decoupling model is built according to a nature of sphere and a spatial position relationship of three laser beams. The plane coordinates of the three laser points are input into the mathematical decoupling model to obtain six-degree-of-freedom information of the measured object.