Si-Tian Gao

Title: Si-Tian Gao: Innovator in Scanning Probes and Spectroscopy

Introduction

Si-Tian Gao is a prominent inventor based in Beijing, China. He has made significant contributions to the field of metrology through his innovative inventions. With a total of three patents to his name, Gao has established himself as a key figure in the development of advanced scientific instruments.

Latest Patents

Gao's latest patents include a "Scanning probe having micro-tip, method and apparatus for manufacturing the same." This invention provides a scanning probe that features a base and a micro-tip with a concavely curved generatrix. The method involves immersing a probe precursor in a corrosive solution while monitoring the corrosion current. The apparatus includes a container for the corrosive solution and a driving device for moving the probe precursor.

Another notable patent is the "Tip-enhanced Raman spectroscope system." This system comprises a laser emitting unit, a laser excitation unit, a dichroic beam splitter, a Raman spectrometer, and a confocal detecting unit. The system is designed to enhance the Raman scattering of light from samples, allowing for more detailed imaging and analysis.

Career Highlights

Si-Tian Gao is affiliated with the National Institute of Metrology, China, where he conducts research and development in metrology and instrumentation. His work has been instrumental in advancing the capabilities of scientific measurement tools.

Collaborations

Gao collaborates with esteemed colleagues such as Zhen-Dong Zhu and Wei Li. Their combined expertise contributes to the innovative projects undertaken at the National Institute of Metrology.

Conclusion

Si-Tian Gao's contributions to the fields of scanning probes and spectroscopy highlight his role as a leading inventor in metrology. His patents reflect a commitment to advancing scientific research and measurement techniques.