The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Jul. 01, 2024
Applicant:

National Institute of Metrology, China, Beijing, CN;

Inventors:

Jianwei Huang, Beijing, CN;

Xuan Zhang, Beijing, CN;

Linjian Wan, Beijing, CN;

Dehong Li, Beijing, CN;

Zhijun Yang, Beijing, CN;

Chuanfeng Liu, Beijing, CN;

Xiaole Zhang, Beijing, CN;

Siming Guo, Beijing, CN;

Yang Yang, Beijing, CN;

Jianbo Cheng, Beijing, CN;

Yilun Xu, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16C 20/20 (2019.01);
U.S. Cl.
CPC ...
G16C 20/20 (2019.02);
Abstract

A nuclide identification method, a system and an electronic device are provided, which relates to the field of nuclide identification. According to statistical characteristics, a background probability density function and a Compton probability density function in a ROI are determined. An energy Bayesian factor and a time Bayesian factor are determined based on energy and time interval information in a sequence of the nuclear detection events obtained by measurement. By combining the two factors, Compton plateau can be effectively identified and distinguished.


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