The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Oct. 11, 2022
National Institute of Metrology, China, Beijing, CN;
Xiaofei Diao, Beijing, CN;
Xinrui Fan, Beijing, CN;
National Institute of Metrology, China, Beijing, CN;
Abstract
The invention discloses a four-quadrant interferometry system based on an integrated array wave plate. PBS splits an output laser light into two paths, the reflected light and the transmitted light are respectively transformed into reference light and measuring light, the reference light and the measuring light are converged in PBS, the converging light enters a signal receiving unit and is split into four beams, and the four beams irradiate on a four-quadrant interference signal detector with an integrated array wave plate. The invention solves the problems that the existing signal detection system occupies a large space, is not conducive to array integration, and cannot be used in scenes with high space and size requirements.