The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Dec. 06, 2023
National Institute of Metrology, China, Beijing, CN;
National Institute of Metrology, China, Beijing, CN;
Abstract
The present invention discloses a method for using RFID tags as carriers for digital calibration certificates and its system, which consists of following steps, i.e., generating standard DCC data; simplifying the DCC data to obtain the DCC-Lite data; after that, the DCC-Lite data is split into obtain multiple XML Lite files; and then, storing and writing multiple RFID tags in the multiple XML Lite files so that the DCC-Lite data can be spliced and restored by reading XML-Lite file information stored correspondence to the multiple RFID tags. The present invention realized unimpeded reading and application of instrument calibration information and data in the off-line state by means of simplifying, segmenting DCC files and storing them in multiple RFID tags respectively. Furthermore, the present invention may also split and store certain DCC-Lite with large amount of data in multiple RFID tags by splitting and splicing its content.