The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Jun. 18, 2025
Applicant:
National Institute of Metrology China, Beijing, CN;
Inventors:
Ying Kan, Beijing, CN;
Ke Li, Beijing, CN;
Zhengdong Zhang, Beijing, CN;
Dan Song, Beijing, CN;
Xin Zhang, Beijing, CN;
Chaomin Ding, Beijing, CN;
Fan Liu, Beijing, CN;
Qi Li, Beijing, CN;
Assignee:
National Institute of Metrology China, Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/25 (2023.01);
U.S. Cl.
CPC ...
G06F 18/251 (2023.01); G06N 20/00 (2019.01);
Abstract
A method, a system, a medium and a device based on multi-spectral data fusion are provided. The method includes: collecting spectrum: collecting NIR spectrum and MIR spectrum of a substance to be detected to obtain a NIR spectrum matrix and a MIR spectrum matrix of the substance to be detected; constructing a detection model; training the detection model; and predicting detection indexes.