Beijing, China

Ying Kan

This inventor holds 1 USPTO granted patent. Top assignee: National Institute of Metrology, China. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ying Kan. Retrieved from https://idiyas.com/inventor/ying-kan-pzec5ogf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Ying Kan in Multi-Spectral Data Fusion

Introduction

Ying Kan is a prominent inventor based in Beijing, China. He has made significant contributions to the field of multi-spectral data fusion, showcasing his expertise through his innovative patents. His work is instrumental in advancing detection methods that leverage spectral data.

Latest Patents

Ying Kan holds 1 patents, one of which is titled "Detection method, system, medium and device based on multi-spectral data fusion." This patent outlines a comprehensive method that includes collecting near-infrared (NIR) and mid-infrared (MIR) spectra of a substance to be detected. The process involves constructing a detection model, training it, and predicting detection indexes, thereby enhancing the accuracy and efficiency of detection systems.

Career Highlights

Ying Kan is affiliated with the National Institute of Metrology, China, where he applies his knowledge and skills to further research and development in metrology and data fusion technologies. His work at this esteemed institution underscores his commitment to innovation and excellence in his field.

Collaborations

Ying Kan collaborates with notable colleagues, including Ke Li and Zhengdong Zhang. Their combined expertise fosters a collaborative environment that drives forward-thinking research and development.

Conclusion

Ying Kan's contributions to multi-spectral data fusion exemplify the impact of innovative thinking in technology. His patents and work at the National Institute of Metrology highlight the importance of advancing detection methods for various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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