The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Oct. 17, 2023
National Institute of Metrology, China, Beijing, CN;
Zhifeng Wu, Beijing, CN;
Caihong Dai, Beijing, CN;
Ling Li, Beijing, CN;
Yanfei Wang, Beijing, CN;
Sijie He, Beijing, CN;
National Institute of Metrology, China, Beijing, CN;
Abstract
A bidirectional reflectance distribution function (BRDF) measurement system and method, an electronic device, and a storage medium. The BRDF measurement system includes: a blackbody, a spectroradiometer and a controller; where in case that the blackbody is heated to a target temperature, it undergoes a solid-liquid phase change; the spectroradiometer is used to measure the blackbody and transmit a first measurement signal to the controller, and in case that the blackbody irradiates a to-be-measured point on a sample surface, the spectroradiometer is further used to measure radiation from the to-be-measured point, and transmit a second measurement signal to the controller; and the controller is used to obtain a BRDF of the to-be-measured point based on the first measurement signal, the second measurement signal, the target geometric relationship, a target mapping relationship and a dimension parameter of the blackbody.