Beijing, China

Sijie He

This inventor holds 1 USPTO granted patent and 5 published patent applications. Top assignee: National Institute of Metrology, China. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sijie He. Retrieved from https://idiyas.com/inventor/sijie-he

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Sijie He - Innovator in BRDF Measurement Technology

Introduction

Sijie He is a prominent inventor based in Beijing, China. He has made significant contributions to the field of optical measurement technology. His innovative work focuses on the development of systems that enhance the accuracy of reflectance measurements.

Latest Patents

Sijie He holds a patent for a "BRDF measurement system and method, electronic device, and storage medium." This invention involves a bidirectional reflectance distribution function (BRDF) measurement system that includes a blackbody, a spectroradiometer, and a controller. The system is designed to measure the reflectance properties of surfaces accurately. It operates by heating the blackbody to a target temperature, causing a solid-liquid phase change. The spectroradiometer measures the blackbody and the radiation from a sample surface, allowing the controller to obtain the BRDF based on various measurement signals and parameters.

Career Highlights

Sijie He is affiliated with the National Institute of Metrology in China. His work at this prestigious institution has allowed him to collaborate with leading experts in the field. His contributions have been recognized for their impact on optical measurement technologies.

Collaborations

Sijie He has worked alongside notable colleagues such as Zhifeng Wu and Caihong Dai. Their collaborative efforts have further advanced the research and development of measurement systems.

Conclusion

Sijie He is a key figure in the innovation of BRDF measurement technology. His patent and work at the National Institute of Metrology highlight his commitment to advancing optical measurement systems. His contributions are essential for improving the accuracy and efficiency of reflectance measurements in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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