Beijing, China

Caihong Dai


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

where 'Filed Patents' based on already Granted Patents

1 patent (USPTO):

Title: Innovation Spotlight on Caihong Dai

Introduction

Caihong Dai is an accomplished inventor based in Beijing, China, known for his significant contributions to the field of measurement systems. With a focused expertise in bidirectional reflectance distribution functions, he has successfully developed innovative technologies that enhance our understanding of surface properties in various applications.

Latest Patents

Caihong Dai holds a patent for a system and method for measuring the bidirectional reflectance distribution function (BRDF). The patented technology encompasses a comprehensive BRDF measurement system that includes a blackbody, a spectroradiometer, and a controller. The system is designed to operate effectively, particularly during the solid-liquid phase change of the blackbody when heated to specific target temperatures. Utilizing the spectroradiometer, the system measures both the blackbody and a sample surface, allowing for precise radiation measurements and detailed data analysis that results in the determination of the BRDF at the evaluated points.

Career Highlights

Dai is currently affiliated with the National Institute of Metrology in China, where he plays a pivotal role in advancing measurement technologies. His commitment to innovation in measurement and optics has led him to develop practices that not only prioritize accuracy but also contribute to the broader field of metrology.

Collaborations

Throughout his career, Caihong Dai has collaborated with notable colleagues, including Zhifeng Wu and Ling Li. These partnerships highlight his collaborative spirit and dedication to advancing research through teamwork and shared expertise, fostering an environment of innovation in the field.

Conclusion

Caihong Dai's innovative contributions to measurement systems exemplify the importance of scientific research and patentable inventions in enhancing our understanding of material properties. His work at the National Institute of Metrology not only underscores his role as an inventor but also reflects the ongoing collaboration and dedication to accuracy within the scientific community in China.

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