The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Nov. 29, 2022
Applicant:

National Institute of Metrology, China, Beijing, CN;

Inventors:

Shiying Chu, Beijing, CN;

You Jiang, Beijing, CN;

Xiang Fang, Beijing, CN;

Zejian Huang, Beijing, CN;

Xinhua Dai, Beijing, CN;

Yuting An, Beijing, CN;

Di Zhang, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/42 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/4295 (2013.01); H01J 49/063 (2013.01); H01J 49/4225 (2013.01);
Abstract

The present invention relates to the technical field of mass spectra. Disclosed are a novel ion storage system and method based on a quadrupole-ion trap tandem mass spectrometry. The system sequentially comprises a heating capillary, a tube lens, a skimmer, a first ion guide, a second ion guide, a quadrupole mass analyzer, an ion trap mass analyzer, and a detector; a first lens is provided between the first ion guide and the second ion guide; a second lens and a third lens are provided between the second ion guide and the quadrupole mass analyzer, wherein operation modes of the first ion guide and the second ion guide comprise an ion transmission mode and an ion storage mode. Compared with conventional time sequence control methods, more ions are stored during the same time according to the present invention, thereby improving the sensitivity of the instrument.


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