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Kanagawa, Japan

Komatsu Denshi Kinzoku Kabushiki Kaisha

USPTO Granted Patents = 15

EPO Patents = 5

Forward Citations = 56

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41 inventors (with patents filed for the assignee):

Toshirou Kotooka (6 out of 14 patents)

Kozo Nakamura (5 out of 15 patents)

Shigeo Morimoto (4 out of 27 patents)

4. Hiroshi Inagaki (4 out of 28 patents)

5. Hiroshi Monden (4 out of 16 patents)

6. Tadayuki Hanamoto (4 out of 8 patents)

7. Shigeki Kawashima (4 out of 13 patents)

8. Daisuke Ebi (3 out of 7 patents)

9. Susumu Maeda (3 out of 12 patents)

10. Toshiaki Saishoji (3 out of 10 patents)

11. Kentaro Nakamura (2 out of 73 patents)

12. Masato Moriya (2 out of 72 patents)

13. Kengo Hayashi (2 out of 4 patents)

14. Tadashi Hata (2 out of 3 patents)

15. Shoei Kurosaka (2 out of 11 patents)

15 patents: Sort by Forward Citations

1. 8246744 - Method for predicting precipitation behavior of oxygen in silicon single crystal, method for determining production parameter of silicon single crystal, and storage medium for storing program for predicting precipitation behavior of oxygen in silicon single crystal (2012-08-21),

2. 8080113 - Method and apparatus for collecting chemicals from semiconductor wafer (2011-12-20),

3. 8002893 - Apparatus for pulling single crystal by CZ method (2011-08-23),

4. 7374614 - Method for manufacturing single crystal semiconductor (2008-05-20),

5. 7329317 - Method for producing silicon wafer (2008-02-12),

6. 7235128 - Process for producing single-crystal semiconductor and apparatus for producing single-crystal semiconductor (2007-06-26),

7. 7160386 - Single crystal semiconductor manufacturing apparatus and manufacturing method, and single crystal ingot (2007-01-09),

8. 7147710 - Method of manufacturing epitaxial silicon wafer (2006-12-12),

9. 7141113 - Production method for silicon single crystal and production device for single crystal ingot, and heat treating method for silicon crystal wafer (2006-11-28),

10. 6994748 - Method and apparatus for measuring melt level (2006-02-07),

11. 6977010 - Apparatus for pulling single crystal by CZ method (2005-12-20),

12. 6869478 - Method for producing silicon single crystal having no flaw (2005-03-22),

13. 6733585 - Apparatus for pulling single crystal by CZ method (2004-05-11),

14. 6572699 - Method and apparatus for detecting melt level (2003-06-03),

15. 6569236 - Device and method for producing single-crystal ingot (2003-05-27),

Komatsu Denshi Kinzoku Kabushiki Kaisha is a Japanese company specializing in the development and manufacturing of electronic components and materials. With over 70 years of experience, they provide a wide range of innovative products including connectors, sensors, and electronic assemblies. The company's commitment to quality and advanced technological solutions has earned them a reputable position in the industry. Visit their website to learn more about their products and services.

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USPTO Data Jan 1 1976 - Dec 30 2025

15 Patents

#105 in Kanagawa

#3,366 in Japan

#38,719 in the World

Kanagawa, Japan

Komatsu Denshi Kinzoku Kabushiki Kaisha

Forward Citations = 56

41 inventors:

Toshirou Kotooka (6 out of 14 patents)

Kozo Nakamura (5 out of 15 patents)

Shigeo Morimoto (4 out of 27 patents)

4. Hiroshi Inagaki (4 out of 28 patents)

5. Hiroshi Monden (4 out of 16 patents)

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