The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Jan. 27, 2005
Applicants:

Kozo Nakamura, Kanagawa, JP;

Junsuke Tomioka, Kanagawa, JP;

Tetsuro Akagi, Kanagawa, JP;

Shiro Yoshino, Kanagawa, JP;

Inventors:

Kozo Nakamura, Kanagawa, JP;

Junsuke Tomioka, Kanagawa, JP;

Tetsuro Akagi, Kanagawa, JP;

Shiro Yoshino, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 29/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

By specifying an initial oxygen concentration in a silicon single crystal and a concentration of thermal donors produced according to a thermal history from 400° C. to 550° C. that the silicon single crystal undergoes during crystal growth, a nucleation rate of oxygen precipitates produced in the silicon single crystal while the silicon single crystal is subjected to a heat treatment is determined. Further, by specifying the heat treatment condition of the silicon single crystal, an oxygen precipitate density and an amount of precipitated oxygen under a given heat treatment condition are predicted by calculation.


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Nakamura, Kozo. (2012). Method for predicting precipitation behavior of oxygen in silicon single crystal, method for determining production parameter of silicon single crystal, and storage medium for storing program for predicting precipitation behavior of oxygen in silicon single crystal (U.S. Patent No. 8246744). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8246744

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