The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Dec. 06, 2004
Applicants:

Susumu Maeda, Hiratsuka, JP;

Hiroshi Inagaki, Hiratsuka, JP;

Shigeki Kawashima, Hiratsuka, JP;

Shoei Kurosaka, Hiratsuka, JP;

Kozo Nakamura, Hiratsuka, JP;

Inventors:

Susumu Maeda, Hiratsuka, JP;

Hiroshi Inagaki, Hiratsuka, JP;

Shigeki Kawashima, Hiratsuka, JP;

Shoei Kurosaka, Hiratsuka, JP;

Kozo Nakamura, Hiratsuka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 15/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A process for producing a single-crystal semiconductor and an apparatus therefor. A single-crystal semiconductor of large diameter and large weight can be lifted with the use of existing equipment not having any substantial change thereto while not influencing the oxygen concentration of single-crystal semiconductor and the temperature of melt and while not unduly raising the temperature of seed crystal. In particular, the relationship (LLL) between the allowable temperature difference (ΔT) and the diameter (D) of seed crystal () is preset so that the temperature difference between the seed crystal () at the time the seed crystal () is immersed in the melt and the melt () falls within the allowable temperature difference (ΔT) at which dislocations are not introduced into the seed crystal (). In accordance with the relationship (LLL), the allowable temperature difference (ΔT) corresponding to the diameter (D) of seed crystal () to be immersed in the melt is determined. Temperature control is conducted so that at the time the seed crystal () is immersed in the melt () the temperature difference between the seed crystal () and the melt () falls within the determined allowable temperature difference (ΔT).


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