The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Sep. 27, 2002
Yutaka Shiraishi, Nagasaki, JP;
Jyunsuke Tomioka, Nagasaki, JP;
Takuji Okumura, Kanagawa, JP;
Tadayuki Hanamoto, Kanagawa, JP;
Takehiro Komatsu, Kanagawa, JP;
Shigeo Morimoto, Kanagawa, JP;
Yutaka Shiraishi, Nagasaki, JP;
Jyunsuke Tomioka, Nagasaki, JP;
Takuji Okumura, Kanagawa, JP;
Tadayuki Hanamoto, Kanagawa, JP;
Takehiro Komatsu, Kanagawa, JP;
Shigeo Morimoto, Kanagawa, JP;
Komatsu Denshi Kinzoku Kabushiki Kaisha, Kanagawa, JP;
Abstract
A single crystal semiconductor manufacturing apparatus in which the concentration of oxygen in a single crystal semiconductor is controlled while pulling up a single crystal semiconductor such as single crystal silicon by the CZ method, a single crystal semiconductor manufacturing method, and a single crystal ingot manufactured by the method are disclosed. The natural convection () in the melt () in a quartz crucible () is controlled by regulating the temperatures at a plurality of parts of the melt (). A single crystal semiconductor () can have a desired diameter by regulating the amount of heat produced by heating means () on the upper side. Further the ratio between the amount of heat produced by the upper-side heating means () and that by the lower-side heating means () is adjusted to vary the process condition. In the adjustment, the amount of heat produced by the lower-side heating means () is controlled to a relatively large proportion. Without inviting high cost and large size of the manufacturing apparatus, the oxygen concentration distribution in the axial direction of the single crystal semiconductor, the diameter of the single crystal semiconductor, and the minute fluctuation of the oxygen concentration in the axial direction are controlled.