% Expired Patents = 16.7

Forward Citations = 96

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13 inventors (with patents filed for the assignee):

Donald Paul McClimans (2 out of 3 patents)

Edward J Merritt, Jr (2 out of 4 patents)

Shu W Wang (2 out of 2 patents)

4. Thomas C Bristow (2 out of 2 patents)

5. John E Stephan (2 out of 2 patents)

6. Silvio P Marchese-Ragona (2 out of 2 patents)

7. Matthew E Seelig (2 out of 2 patents)

8. Joseph R Bietry (1 out of 81 patents)

9. Dag Lindquist (1 out of 2 patents)

10. Kenneth J Li (1 out of 1 patent)

11. John A Teleska (1 out of 2 patents)

12. Robert Bryant (1 out of 1 patent)

13. Joan E Samuels (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 7283256 - Method and apparatus for measuring wafer thickness (2007-10-16),

2. 7280232 - Method and apparatus for measuring wafer thickness (2007-10-09),

3. 6342705 - System for locating and measuring an index mark on an edge of a wafer (2002-01-29),

4. 6157450 - Automated optical surface profile measurement system (2000-12-05),

5. 5986753 - Wafer holding and orienting fixture for optical profilometry (1999-11-16),

6. 5017012 - Viewing system for surface profiler (1991-05-21),

Company Overview

Chapman Instruments, Inc. is a leading manufacturer of precision measuring instruments for a variety of industries. With over 30 years of experience, we specialize in providing high-quality products such as digital calipers, micrometers, and height gauges. Our instruments are designed to meet the needs of professionals in fields ranging from automotive to aerospace. Visit our website to learn more about our products and services.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#101 in Rochester, NY

#2,697 in New York

#45,007 in US

Rochester, NY, United States of America

Chapman Instruments, Inc.

Forward Citations = 96

13 inventors:

Donald Paul McClimans (2 out of 3 patents)

Edward J Merritt, Jr (2 out of 4 patents)

Shu W Wang (2 out of 2 patents)

4. Thomas C Bristow (2 out of 2 patents)

5. John E Stephan (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Chapman Instruments, Inc.. Retrieved from https://idiyas.com/company/chapman-instruments

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]