Enter assignee name

% Expired Patents = 16.7

Forward Citations = 96

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13 inventors (with patents filed for the assignee):

Donald Paul McClimans (2 out of 3 patents)

Edward J Merritt, Jr (2 out of 4 patents)

Shu W Wang (2 out of 2 patents)

4. Thomas C Bristow (2 out of 2 patents)

5. John E Stephan (2 out of 2 patents)

6. Silvio P Marchese-Ragona (2 out of 2 patents)

7. Matthew E Seelig (2 out of 2 patents)

8. Joseph R Bietry (1 out of 80 patents)

9. Dag Lindquist (1 out of 2 patents)

10. Kenneth J Li (1 out of 1 patent)

11. John A Teleska (1 out of 2 patents)

12. Robert Bryant (1 out of 1 patent)

13. Joan E Samuels (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 7283256 - Method and apparatus for measuring wafer thickness (2007-10-16),

2. 7280232 - Method and apparatus for measuring wafer thickness (2007-10-09),

3. 6342705 - System for locating and measuring an index mark on an edge of a wafer (2002-01-29),

4. 6157450 - Automated optical surface profile measurement system (2000-12-05),

5. 5986753 - Wafer holding and orienting fixture for optical profilometry (1999-11-16),

6. 5017012 - Viewing system for surface profiler (1991-05-21),

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Profile summary based on public USPTO records.