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Forward Citations = 96

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13 inventors (with patents filed for the assignee):

Donald Paul McClimans (2 out of 3 patents)

Edward J Merritt, Jr (2 out of 4 patents)

Shu W Wang (2 out of 2 patents)

4. Thomas C Bristow (2 out of 2 patents)

5. John E Stephan (2 out of 2 patents)

6. Silvio P Marchese-Ragona (2 out of 2 patents)

7. Matthew E Seelig (2 out of 2 patents)

8. Joseph R Bietry (1 out of 79 patents)

9. Dag Lindquist (1 out of 2 patents)

10. Kenneth J Li (1 out of 1 patent)

11. John A Teleska (1 out of 2 patents)

12. Robert Bryant (1 out of 1 patent)

13. Joan E Samuels (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 7283256 - Method and apparatus for measuring wafer thickness (2007-10-16),

2. 7280232 - Method and apparatus for measuring wafer thickness (2007-10-09),

3. 6342705 - System for locating and measuring an index mark on an edge of a wafer (2002-01-29),

4. 6157450 - Automated optical surface profile measurement system (2000-12-05),

5. 5986753 - Wafer holding and orienting fixture for optical profilometry (1999-11-16),

6. 5017012 - Viewing system for surface profiler (1991-05-21),

Chapman Instruments, Inc. is a leading manufacturer of precision measuring instruments for a variety of industries. With over 30 years of experience, we specialize in providing high-quality products such as digital calipers, micrometers, and height gauges. Our instruments are designed to meet the needs of professionals in fields ranging from automotive to aerospace. Visit our website to learn more about our products and services.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 23 2025

6 Patents

#98 in Rochester, NY

#2,570 in New York

#43,751 in US

Rochester, NY, United States of America

Chapman Instruments, Inc.